IEEE Transactions on Pattern Analysis and Machine Intellegence

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Subject: IEEE Transactions on Pattern Analysis and Machine Intellegence
Date: Fri, 29 Aug 1997 14:47:10 -0400 (EDT)

IEEE Transactions on Pattern Analysis and Machine Intellegence

http://computer.org/tpami/

The IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI)
is published monthly. Its Editorial Board strives to publish papers that
present important research results within TPAMI's scope. These include
statistical and structural pattern recognition; image analysis;
computational models of vision; computer vision systems;  enhancement,
restoration, segmentation, feature extraction, shape and texture analysis;
applications of pattern analysis in medicine, industry, government, and
the arts and sciences; artificial intelligence, knowledge representation,
logical and probabilistic inference, learning, speech recognition,
character and text recognition, syntactic and semantic processing,
understanding natural language, expert systems, and specialized
architectures for such processing.

The full text of TPAMI is online as part of the CS Digital Library open
trial period. Access will be limited to CS members later in the year, and
to online TPAMI subscribers in 1998.   Articles are available as PDF
files.

Recent Contents:

REGULAR PAPERS

     Optimal Local Weighted Averaging Methods in Contour Smoothing 
     R. Legault and C.Y. Suen 
              

     Bias in Robust Estimation Caused by Discontinuities and Multiple
     Structures 
     C.V. Stewart 
              

     Affine Structure from Line Correspondences With Uncalibrated Affine
     Cameras 
     L. Quan and T. Kanade 
              

     Wavelet-Based Affine Invariant Representation: A Tool for Recognizing
     Planar Objects in 3D Space 
     Q.M Tieng and W.W. Boles 
              

     A Sequential Factorization Method for Recovering Shape and Motion
     from Image Streams 
     T. Morita and T. Kanade 
              

     A System for Recognizing a Large Class of Engineering Drawings 
     Y. Yu, A. Samal, and S.C. Seth 
              

     Use of the Fourier and Karhunen-Loeve Decomposition for Fast Pattern
     Matching With a Large Set
     of Templates 
     Uenohara and T. Kanade 
              

     On the Sequential Determination of Model Misfit 
     P. Whaite and F.P. Ferrie 
              

     Hough Transform Modified by Line Connectivity and Line Thickness 
     M.C.K. Yang, J.-S. Lee, C.-C. Lien, and C.-L. Huang 

Contact:

Rangachar Kasturi, Editor-in-Chief, kasturi@cse.psu.edu