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IEEE Instrumentation and Measurement Magazine



               

Cynde Reid Gustafson wrote:
From: "Cynde Reid Gustafson" <nj@ccat.sas.upenn.edu>
Subject: IEEE Instrumentation and Measurement Magazine
Date: Tue, 16 Apr 2002 22:20:19 -0400

IEEE Instrumentation and Measurement Magazine

http://ieeexplore.ieee.org/lpdocs/epic03/RecentIssues.htm?punumber=5289
(Link inactive 22 April 2005)

http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5289
(Link active 22 April 2005)

IEEE Instrumentation and Measurement Magazine focuses on sensor
technology, process control, automated instrumentation, imaging
systems, high-frequency instrumentation, calibration and standards,
sensitivity and noise, frequency and time, materials characterization,
wireless and telecommunications and transport systems. Readers
are involved with standardization and calibration as well as
emerging technologies.

Subscribers have access to full-text articles in PDF format.

Editor in Chief: Kim R. Fowler
Email: coolstream@att.net


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