Radiation Effects and Defects in Solids

Radiation Effects and Defects in Solids

http://www.tandf.co.uk/journals/titles/10420150.html

Aims and Scope:

Experimental and theoretical papers of both a fundamental 
and applied nature that contribute to the understanding of 
either phenomena induced by the interaction of radiation 
with condensed matter or defects in solids introduced not 
only by radiation but also by other processes are published 
in three groups.

Section A: Radiation Effects ÷ Suitable topics include 
atomic collisions, radiation induced atomic and molecular 
processes in solids, the stopping and range of ions and 
radiation damage, sputtering and mixing in solids, 
radiation-induced transport phenomena and the role of 
defects and impurities introduced by radiation. Papers on 
ion implantation in metals and semiconductors as well as on 
radiation effects in insulators and superconductors, in 
fusion and fission devices and in space research and 
studies on fission tracks, isotope dating and ion beam 
analytic techniques are also welcome.

Section B: Crystal Lattice Defects and Amorphous Materials 
÷ Topics covered include atomic and electronic properties 
of defects, the influence of defects on lattice properties 
and processes, the lattice-defect approach to solid state 
reactions such as clustering, precipitation, laser 
annealing and the role of impurities, the defect dynamics 
in a non-steady state such as under particle or 
electromagnetic irradiation or during a rapid temperature 
change and problems associated with the metastable nature 
of amorphous materials.

NEW Section C: Biological Applications ÷ Contributions from 
the fields of fundamental and applied radiobiology are 
invited for our new Biological Applications Section. Topics 
will include tumour radio-therapy and fundamental research 
in radiative cell degeneration. 

Editor: Jochen P. Biersack, Hahn-Meitner-Institut, 
Glienicker Straße 100, Berlin, 14109 Germany

Publication Details: 
Volume 158, 2003, 12 issues per year

ISSN 1042-0150

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